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1 ? fn6229.0 ISL55100B quad 18v pin electronics driver/window comparator the ISL55100B is a quad pin driver and window comparator fabricated in a wide voltage cmos process. it is designed specifically for test during burn in (tdbi) applications, where cost, functional density, and power are all at a premium. this ic incorporates four channels of programmable drivers and window comparators into a small 72 ld qfn package. each channel has independent driver levels, data, and high impedance control. each receiver has dual comparators which provide high and low threshold levels. the ISL55100B uses differential mode digital inputs, and can therefore mate directly with lvds or cml outputs. single ended logic families are handled by connecting one of the digital input pins to an appropriate threshold voltage (e.g., 1.4v for ttl compatibility). the comparator outputs are single ended, and the output leve ls are user defined to mate directly with any digital technology. the 18v driver output and receiver input ranges allow this device to interface directly with ttl, ecl, cmos (3v, 5v, and 7v), lvcmos, and custom level circuitry, as well as the high voltage (super voltage) level required for many special test modes for flash devices. functional block diagram features ? low driver output resistance -r out typical: 9.0 ? ? 18v i/o range ? 50mhz operation ? 4 channel driver/receiver pairs with per pin flexibility ? dual level - per pin - input thresholds ? differential or single ended digital inputs ? user defined comparator output levels ? low channel to channel timing skew ? small footprint (72 ld qfn) ? pb-free plus anneal available (rohs compliant) applications ? burn in ate ? wafer level flash memory test ? lcd panel test ? low cost ate ? instrumentation ?emulation ? device programmers cva(0-3) cvb(0-3) vinp(0-3) qa(0-3) comp high data-(0-3) drven+(0-3) data+(0-3) vh(0-3) vl(0-3) comp low v cc v ee comp high comp low v cc v ee qb(0-3) quad - dual level comparator - receivers + - + - dout(0-3) drven-(0-3) quad - wide range, low rout, tri-stateable - drivers ordering information part number part marking temp. range (c) package pkg. dwg. # ISL55100Birz (see note) ISL55100Birz -40 to +85 72 ld qfn (pb-free) l72.10x10 add ?-t? suffix for tape and reel. note: intersil pb-free plus anneal pr oducts employ special pb-free material sets; molding compounds/die attach materials and 100% matte tin plate termination finish, which are rohs compliant and compatible with both snpb and pb-fr ee soldering operations. intersil pb-free products are msl classified at pb-free peak reflow temperatures that meet or exceed the pb-free requirements of ipc/jedec j std-020. data sheet march 17, 2006 caution: these devices are sensitive to electrosta tic discharge; follow proper ic handling procedures. 1-888-intersil or 1-888-468-3774 | intersil (and design) is a registered trademark of intersil americas inc. copyright intersil americas inc. 2006. all rights reserved all other trademarks mentioned are the property of their respective owners.
2 fn6229.0 march 17, 2006 pinout ISL55100B (qfn) top view drv en+ 0 drv en- 0 qa 0 qb 0 72 71 70 69 68 67 66 65 64 63 62 61 vee vcc nc nc nc nc v ee v cc 60 59 v ee v cc v ext vh 0 dout 0 nc vl 0 vh 1 dout 1 nc vl 1 vh 2 dout 2 nc vl 2 vh 3 1 2 3 4 5 6 7 8 9 10 11 12 13 14 54 53 52 51 50 49 48 47 46 45 44 43 42 41 data+ 0 data- 0 qa 1 qb 1 drv en+ 1 drv en- 1 data+ 1 data- 1 qa 2 qb 2 drv en+ 2 drv en- 2 data+ 2 data- 2 19 20 21 22 23 24 25 26 27 28 29 30 31 32 data+ 3 data- 3 cva 0 vinp 0 cvb 0 comp high comp low v ee v cc cva 1 vinp 1 cvb 1 cva 2 vinp 2 15 16 17 18 qa 3 qb 3 drv en+ 3 drv en- 3 33 34 35 36 cvb 2 cva 3 cvb 3 vinp 3 dout 3 nc vl 3 loswing 40 39 38 37 58 57 nc nc 56 55 nc nc ISL55100B
3 fn6229.0 march 17, 2006 pin descriptions pin function data+(0:3) positive differential digital input that det ermines the driver output state when it is enabled. data-(0:3) negative differential digital input that determines the driver output state when it is enabled. drv en +(0:3) positive differential digital input that enables or disables the corresponding driver. drv en -(0:3) negative differential digital input that enables or disables the corresponding driver. qa (0:3) comparator digital outputs. qa(x) is high when vinp(x) exceeds cva(x). qb (0:3) comparator digital outputs. qb(x) is high when vinp(x) exceeds cvb(x). dout (0:3) driver outputs. vinp (0:3) comparator inputs. vh (0:3) unbuffered analog inputs that set eac h individual driver?s ?high? voltage level. vl (0:3) unbuffered analog inputs that set each individual driver ?s ?low? voltage level. vl must be a lower voltage than vh. nc no internal connection. cva (0:3) analog inputs that set the threshold for the corresponding channel?s a comparators. cvb (0:3) analog inputs that set the threshold fo r the corresponding channel?s b comparators. comp hi supply voltage, unbuffered input that sets the high out put level of all comparators. must be greater than comp lo. comp lo supply voltage, unbuffered input that sets the low output level of all comparators. must be less than comp hi. v cc positive power supply (5% tolerance). v ee negative power supply (5% tolerance). v ext external 5.5vdc power s upply (-0%+5% tolerance, referenced to v ee , not gnd) for internal logic. connect pin to v ee when not using an external supply. loswing input that selects driver output configurations optimized to yield minimum overshoots fo r low level swings (vh < v ee +5v), or optimized for large output swings. connect loswing to v ee to select low swing circuitry, or connect it to v cc to select high swing circuitry. truth tables drivers inputs output data drv en dout x+ > -hi - z + > - + < - vh + < - + < - vl x = don?t care receivers input outputs vinp qa qb cvb 0 1 >cva cva >cvb 1 1 ISL55100B
4 fn6229.0 march 17, 2006 absolute maximum rati ngs thermal information v cc to v ee . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5v to 19v v ext to v ee . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5v to 7v input voltages data, drv en , cvx, vh, vl, vinp, compx, loswing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . (v ee -0.5v) to (v cc +0.5v) output voltages dout . . . . . . . . . . . . . . . . . . . . . . . . (v ee -0.5v) to (v cc +0.5v) qx . . . . . . . . . . . . . (comp low -0.5v) to (comp high +0.5v) thermal resistance (typical, note 1) ja (c/w) jc (c/w) 72 ld qfn package. . . . . . . . . . . . . . . 23 2.0 maximum junction temperature (plastic package) . . . . . . . 150c maximum storage temperature range . . . . . . . . . . . -65c to 150c maximum lead temperature (soldering 10s) . . . . . . . . . . . . 300c caution: stresses above those listed in ?absolute maximum ratings? may cause permanent damage to the device. this is a stress o nly rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. note: 1. ja is measured in free air with the component mounted on high effe ctive thermal conductivity test board with ?direct attach? feat ures. see tech brief tb379 and tech brief tb389 for details. device temperature is closely tied to data-rates, driver loads and overall pin ac tivity. review power dissipation considerations for more information. recommended operating conditions parameter symbol min typ max units device power-(v ext = v ee) v ext not used v cc -v ee 12 (note 5) 15 18 v device power-(v ext = v ee +5.5v) v cc -v ee 9 (note 5) 15 18 v v ext optional external logic power v ext -v ee 5.5 (note 5) 5.75 6.0 v driver output high rail v h v ee +1 - v cc -0.5 v driver output low rail v l v ee +0.5 - v ee +6 v comparator output high rail comp-high v ee +1 - v cc -0.5 v comparator output low rail comp-low v ee +.5 - v ee +6 v ambient temperature t a -40 - +85 c junction temperature t j - - +150 c electrical specifications test conditions: v cc = 12v, v ee = -3v, vh = 6v, vl = 0v, comp-high = 5v, comp low = 0v, v ext = v ee and loswing = v cc, 25c; unless otherwise specified. parameter symbol test conditions min typ max units driver dc characteristics ISL55100B output resistance r outd i o = 125ma, data not toggling 6 9 14 ? ISL55100B dc output current iout d per individual driver 125 - - ma ISL55100B ac output current (note 2) ioutdac per individual driver - 600 - ma isl55100a minimum output swing v omin v h = 200mv, v l = 0v 185 - - mv disabled hiz leakage current hiz v out = v cc with v h = v l + v ee or v out = vee with v h = v l = v cc -1 0 1 a driver timing characteristics data to dout propagation delay t pd lowswing disabled (note 4) 5 12 16 ns lowswing enabled (note 4) 6 13 17 ns driver timing skew, all edges (note 2) - <1 - ns disable (hiz) time t dis dvren transition from enable to disable 15 18 26 ns enable time t en dvren transition from disable to enable: lowswing disabled (note 4) 13 15 23 ns dvren transition from disable to enable: lowswing enabled (note 4) 13 18 23 ns ISL55100B
5 fn6229.0 march 17, 2006 ISL55100B rise/fall times (note 2) t r , t f 100pf load ? v = 0.4v (20% - 80%) -2.5 - ns ? v = 1v (20% - 80%) -2.5 - ns ? v = 5v (10% - 90%) -3.0 - ns ? v = 10v (10% - 90%) -3.5 - ns ? v = 14v (10% - 90%) -3.5 - ns ISL55100B rise/fall times (note 2) t r , t f 1000pf load ? v = 1 v (20% - 80%) -9 - ns ? v = 5v (10% - 90%) -11 - ns ? v = 10v (10% - 90%) -14 - ns ISL55100B maximum toggle frequency fmaxd no load, 50% symmetry 50 65 - mhz ISL55100B min driver pulse width t widd standard load, 1k/100pf - 7.7 - ns ISL55100B overshoot lowswing mode (note 2) os lowswing enabled, (vh-vl<2v) - 20mv+ 10% of output swing -% + v receiver dc characteristics input offset voltage v os cva = cvb = 1.5v -200 - 200 mv input bias current i bias v inp - cv (a/b) = 5v - 10 30 na output resistance routr 18 25 35 ? receiver timing characteristics propagation delay t pp 71218 ns maximum operating frequency f maxr under no load, pwout symmetry 50% 50 65 - mhz min pulse width t widr -7.7 - ns rcvr channel to channel skew (note 2) - <1 - ns digital inputs differential input high voltage v diffh v dig+ - v dig- 200 - - mv differential input low voltage v diffl v dig+ - v dig- - - -200 mv input current i in v in = v cc or v ee -50 0 50 na common mode input voltage range v cm v diffl not greater than v diffh -0.2 volts v cc -5v v v diffh not less than v diffl +0.2 volts v ee +0.2v - - v power supplies, driver/receiver static conditions v ext = v ee, external logic power option not used . (note 6) positive supply current i cc v cc = v h = 12v, v ee = v l = -3v, v ext =v ee , outputs unloaded -6585 ma negative supply current i ee v cc = v h = 12v, v ee = v l = -3v, v ext =v ee , outputs unloaded -85 -65 - ma v ext supply current i ext v cc = v h = 12, v ee = v l = -3v, v ext =v ee , outputs unloaded -<1 - ma electrical specifications test conditions: v cc = 12v, v ee = -3v, vh = 6v, vl = 0v, comp-high = 5v, comp low = 0v, v ext = v ee and loswing = v cc, 25c; unless otherwise specified. (continued) parameter symbol test conditions min typ max units ISL55100B
6 fn6229.0 march 17, 2006 power supplies, driver/receiver static conditions v ext = v ee + 5.5v, external logic power option used . (note 7) positive supply current i cc v cc = v h = 12v, v ee = v l = -3v, v ext =v ee +5.5v, outputs unloaded -3550 ma negative supply current i ee v cc = v h = 12v, v ee = v l = -3v, v ext =v ee +5.5v, outputs unloaded -50 -35 - ma v ext supply current i ext v cc = v h = 12, v ee = v l = -3v, v ext =v ee + 5.5v, outputs unloaded -2540 ma notes: 2. lab characterization, room temp, timing parameters matched st imulus/loads, channel to channel skew < 500ps, 1ns max by design . 3. measured across 100pf/1k lump sum load + 15pf pcb/scope probe. cap and resistor surface mount/stacked ~0.5inch from pin. 4. to enable lowswing , connect lowswing to v ee and keep vh < v ee +5. to disable lowswing , connect it to v cc. 5. when v ext is connected to v ee (external device power not used) then the minimum v cc -v ee is 12v. when v ext is connected to an external 5.5v supply, then the minimum v cc -v ee voltage is 9.0v. 6. i cc & i ee values are based on static conditions and will increase with pattern rates. i cc & i ee reach 400-500ma at maximum data rates (provided sufficient device cooling is em ployed). these currents can be reduced by 1) reducing the v cc -v ee operating voltage 2) utilizing the v ext option. 7. when using v ext = 5.5v, current requirements of the v ext input can approach 100ma at maximum pattern rates. test circuits and waveforms figure 1. driver switching test circuit figure 2. driver propagation delay and transition time measurement points electrical specifications test conditions: v cc = 12v, v ee = -3v, vh = 6v, vl = 0v, comp-high = 5v, comp low = 0v, v ext = v ee and loswing = v cc, 25c; unless otherwise specified. (continued) parameter symbol test conditions min typ max units 1k ? v o data- drv en + drv en - vh vl dout data+ (note 3) 100pf v o 400mv 0v t pdlh v oh ( v h ) v ol ( v l ) 50% 50% t pdhl data- data+ t r t f data = 1 data = 0 ISL55100B
7 fn6229.0 march 17, 2006 application information the ISL55100B provides quad pin drivers and quad dual level comparator receivers in a small footprint. the four channels may be used as bidirectional or split channels. drivers have per channel level, data, and high impedance controls, while comparators have per channel high and low threshold levels. receiver features the receivers are four independe nt window comparators that feature high output current capability, and user defined high and low output levels to interface with a wide variety of logic families. each receiver, comprises two comparators and each comparator has an independent threshold level input, making it easy to implement window comparator functions. the cva and cvb pins set the threshold levels of the a and b figure 3. driver enable and disable time measurement points figure 4. receiver switching test circuit figure 5. receiver propagation delay measurement points test circuits and waveforms (continued) v o 400mv 0v t disl v ol ( v l ) 1v 10% t enh drv en - drv en + dis en (for data = 0) v ref v o v oh ( v h ) 2v 90% (for data = 1) v ref t dish t enl + - + - vinp qa qb comp hi comp lo cva cvb 5v qx 500mv -500mv t pdlh v oh ( 5v) v ol ( 0v) 50% 50% t pdhl vinp 0v 0v ISL55100B
8 fn6229.0 march 17, 2006 comparators respectively. comp high and comp low set all the comparator output levels, and comp high must be more positive than comp low. these two inputs are unbuffered supply pins, so t he sources driving these pins must provide adequate current for the expected load. comp high and comp low typically connect to the power supplies of the logic device driven by the comparator outputs. the truth table for the receivers is given on page 3. receiver outputs cannot be placed in a hiz state, and do not incorporate any on-chip short circuit current protection. momentary short circuits to gn d, or any supply voltage, won?t cause permanent damage, but ca re must be taken to avoid longer duration short circuits. if tolerable to the application, current limiting resistors can be inserted in series with the qa(0-3) and qb(0-3) outputs to protect the receiver outputs from damage due to overcurrent conditions. driver features the drivers are single ended outputs featuring a wide voltage range, an output stage capable of delivering 125ma while providing a low out resistance and hiz capability. the driver output can be toggled to drive one of two user defined output levels high (vh) or low (vl). driver waveforms are greatly affected by load characteristics. the ISL55100B actually double bonds the vh(0-3) and vl(0-3) supply pins for each channel. the driver output pins (dout(0-3)) are triple bonded. multiple bond wires help reduce the effects of inductance between the ic die (wafer) and the pack aging. also the qfn style of packaging reduces inductance over other types of packaging. while the inductance of a bond wire might seem insignificant, it can reduce hi gh-frequency waveform fidelity. so this should be borne in mind when doing pcb layout and dut interconnect. lead lengths should be kept as short as possible, maintaining as much decoupling on the drive rails as possible and make sure scope measurements are made properly. often the inductance of a scope probe ground can be the actual cause of the waveform distortion. vh and vl (driver output rails) sets of vh and vl pins are designated for each driver. these are unbuffered analog inputs that determine the drive high (vh) and drive low (vl) vo ltages that the drivers will deliver. these inputs are double bonded to reduce inductance and decrease ac impedance. each vh and vl should be decoupled with 4.7f and 0.1f capacitors to ground. if all four driver vh/vls are bussed, then one 4.7f can be used. layouts should also accommodate the placement of capacitance ?across? vh and vl. so in addition to decoupling the vh/vl pins to ground, they are also decoupled to each other. logic inputs the ISL55100B uses differential mode digital inputs, and can therefore mate directly with lv ds or cml outputs. single ended logic families are handled by connecting one of the digital input pins to an appropriate threshold voltage (e.g., 1.4v for ttl compatibility). loswing circuit option the drivers include switchable circuitry that is optimized for either low (vh-vl < 3v) or high output swings. configuring the part is accomplished via the loswing pin. connecting loswing to v ee selects the circuits optimized for low overshoots at low swing operation. connecting the pin to v cc enables the large signal circuitry. (see figure 6) with loswing = v ee , the low swing circuitry activates whenever vh < v ee + 5v. set loswing = v ee only if the output swing (vh-vl) is less than 3v, and better than 10% overshoots are required. for the best small ( low swing) signal performance, the vh/vl common mode voltage [(vh + vl)/2] must be v ee + 1.5v. so if v ee = 0v, and the desired swing is 500mv, set vh = 1.75v, and vl = 1.25v. driver and receiver overload protection the isl55100 is designed to provide minimum and balanced driver rout. great care should be taken when making use of the ISL55100B low rout drivers as there is no internal protection. there is no short circ uit protection built into either the driver or the receiver/compa rator outputs. also there are no junction temperature monitors or thermal shutdown features. the driver or receiver outputs may be damaged by more than a momentary short circuit directly to any low impedance voltage. driver protection can be obtained with a 50 ? series termination resistor that is properly rated. external logic supply option (v ext ) connection of the v ext pin to a 5.5v dc source (referenced to v ee ) will reduce the v cc -v ee current drain. current drain is directly proportional to data rate. this option will help with power supply/dissipation should heat distribution become an issue. power supply bypassing and printed circuit board layout as with any high frequency device, good printed circuit board layout is necessary for optimum performance. ground plane construction is highly recommended, lead lengths should be as short as possible, and the power supply pins must be well bypassed to reduce the risk of oscillation. for normal single supply operation, where the v ee pin is connected to ground, one 0.1f ceramic capacitor should be placed from the v cc pin to ground. a 4.7f tantalum capacitor should then be connected from the v cc pin to ground. this same capacitor combination should be placed at each supply pin to ground if split supplies are to be used. ISL55100B
9 fn6229.0 march 17, 2006 power dissipation considerations specifying continuous data rates, driver loads and driver level amplitudes are key in determining power supply requirements as well as dissipation/cooling necessities. driver output patterns also impact these needs. the faster the pin activity, the greater the need to supply current and remove heat. figures 16 and 17 address power consumption relative to frequency of operation. these graphs are based on driving 6.0/0.0v out into a 1k ? load. theta j a for the device package is 23.0, 16.6 and 14.9 c/w based on airflows of 0, 1 and 2.5 meters per second. device mounted per note 1 under thermal information. with the high speed data rate capability of the ISL55100B, it is possible to exceed the 150c ?absolute-maximum junction temperature? as operating conditions and frequenc ies increase. therefore, it is important to calculate the maximum junction temperature for the application to determine if operating conditions need to be modified for the device to remain in the safe operating area. the maximum power dissipation allowed in a package is determined according to: where: ?t jmax = maximum junction temperature ?t amax = maximum ambient temperature ? ja = thermal resistance of the package ?p dmax = maximum power dissipation in the package the maximum power dissipation actually produced by an ic is the total quiescent supply current times the total power supply voltage, plus the power in the ic due to the loads. power also depends on number of channels changing state, frequency of operation. the exte nt of continuous active pattern generation/reception will greatly effect dissipation requirements. the power dissipation curves (figure 16), provide a way to see if the device will overheat. the maximum safe power temperature vs operating frequency can be found graphically in figure 17. this graph is based on the package type theta j a ratings and actual current/wattage requirements of the ISL55100B when driving a 1k load with a 6v high level and a 0v low rail. the temperatures are indicated as calculated junc tion temperature over the ambient temperature of the us er?s system. plots indicate temperature change as operati ng frequency increases. (the graph assumes continuous operation.) the user should evaluate various heat sink/cooling options in order to control the ambient temperature part of the equation. this is especially true if the users a pplications require continuous, high speed operation. the reader is cautioned against assuming the same level of thermal performance in actual applications. a careful inspection of conditions in your application should be conducted. great care must be taken to ensure die temperature does not exceed 150c absolute maximum thermal limits. important note: the ISL55100B package metal plane is used for heat sinking of the device. it is electrically connected to the negati ve supply potential (v ee ). if v ee is tied to ground, the thermal pad can be connected to ground. otherwise, the thermal pad (v ee ) must be isolated from other power planes. power supply sequencing the ISL55100B references every supply with respect to vee. therefore apply vee, then vcc followed by the vh,vl busses, then the comp high and comp low followed by the cva & cvb supplies. digital inputs should be set with a differential bias as soon as possible. in cases where v ext is being utilized (v ext = v ee + 5.5v), it should be powered up immediately after v cc . basically, no pin should be biased above v cc or below v ee . data rates please note that the frequency - mhz in figures 16 and 17 contain two transitions within each period. a digital application that requires a new test pattern every 50ns would be running at a 20mhz data rate. figure 18 reveals 100ns period, in 10mhz frequency parlance, results in two 50ns digital patterns. p dmax t jmax - t amax ja -------------------------------------------- - = ISL55100B
10 fn6229.0 march 17, 2006 typical performance curves device installed on intersil ISL55100B evaluation board. figure 6. lowswing effects on driver shape and t pd (100pf-1k load) figure 7. driver waveforms under various loads figure 8. data/hiz/driver out timing figure 9. r out vs device voltage figure 10. r out vs vh rail figure 11. propagation delay vs vh rail, various loads 0 0 10ns/div 0.5v/div 0.5v/div vcc 12.0 dh 6.0 vee - 3.0 dl 0.0 /lowswing off /lowswing on 0 0 10ns/div 2v/div 2200pf 1000pf 680pf 1k100pf data in vcc 12.0 dh 6.0 vee - 3.0 dl 0.0 tristate/data/dout timing 0 0 20ns/div 2v/div 2v/div drven data in driver out 0 10.0 5.0 0.0 12 13 14 15 16 17 18 vcc-vee volts (vee -3.0 fixed) vh (6.00 volts) rout : driver sources 125ma vl (0.0v volts) rout : driver sinks 125ma rout @ 125ma dc 8.0 7.2 6.4 5.6 4.8 4.0 3.2 2.4 1.6 0.8 0.0 123456789101112131415 vh volts (vl = 0.0) vh (1v-15v) rout : driver sources 125ma vl (0.0v fixed) rout : driver sinks 125ma rout @ 125ma dc 20.0 18.0 16.0 14.0 12.0 10.0 8.0 6.0 4.0 2.0 0.0 1234567891011121314 vh volts (vl = 0.0) 2200pf 1000pf 680pf 1k100pf ISL55100B
11 fn6229.0 march 17, 2006 figure 12. driver fall time vs vh rail, various loads figure 13. driver & receiver tpd variance vs v cc figure 14. driver rise time vs vh rail, various loads figure 15. static i cc vs v cc figure 16. device power dissipation with v cc -v ee = 18, 12 & 9.0 (v ext = 5.5v) volts. all four pins making two transitions per period figure 17. calculated junction temp above ambient with v cc -v ee = 18, 12 & 9.0 (v ext = 5.5v) volts. all four pins making two transitions per period typical performance curves device installed on intersil ISL55100B evaluation board. (continued) 45.0 40.5 36.0 31.5 27.0 22.5 18.0 13.5 9.0 4.5 0.0 1234567891011121314 vh volts (vl = 0.0) 2200pf 1000pf 680pf 1k100pf 20.0 18.0 16.0 14.0 12.0 10.0 8.0 6.0 4.0 2.0 0.0 11 12 13 14 15 16 17 18 19 driver tpd .. no load comparator tpd .. no load tpd in ns vcc-vee (vee = -3.0) 35.0 31.5 28.0 24.5 21.0 17.5 14.0 10.5 7.0 3.5 0.0 1234567891011121314 vh volts (vl = 0.0) 2200pf 1000pf 680pf 1k100pf rise time (ns) 100 90 80 70 60 50 40 30 20 10 0 11 12 13 14 15 16 17 18 19 icc static conditions icc (ma) v cc -v ee (v ee = -3.0) 10.0 9.0 8.0 7.0 6.0 5.0 4.0 3.0 2.0 1.0 0.0 5 1015202530354045505560 frequency (mhz) 18v v cc 12v v cc 9v v cc & v ext = 5.5v power dissipation (w) 150 135 120 105 90 75 60 45 30 15 0 5 1015202530354045505560 frequency (mhz) airflow legend a = 0m/s : b = 1.0m/s : c = 2.5m/s 18v v cc 12v v cc 9v v cc & v ext = 5.5v a b c a b c a b c (c) ISL55100B
12 fn6229.0 march 17, 2006 figure 18. frequency of 10mhz = 50ns pattern rate figure 19. minimum pulse width vh 6/8/10v typical performance curves device installed on intersil ISL55100B evaluation board. (continued) 0 0 2v/div vcc 12.0 dh 6.0 vee - 3.0 dl 0.0 2v/div 0 10ns/div 1v/div vcc 12.0 dh 6.0 vee - 3.0 dl 0.0 ISL55100B
13 all intersil u.s. products are manufactured, asse mbled and tested utilizing iso9000 quality systems. intersil corporation?s quality certifications ca n be viewed at www.intersil.com/design/quality intersil products are sold by description only. intersil corpor ation reserves the right to make changes in circuit design, soft ware and/or specifications at any time without notice. accordingly, the reader is cautioned to verify that data sheets are current before placing orders. information furnishe d by intersil is believed to be accurate and reliable. however, no responsibility is assumed by intersil or its subsidiaries for its use; nor for any infringements of paten ts or other rights of third parties which may result from its use. no license is granted by implication or otherwise under any patent or patent rights of intersil or its subsidiari es. for information regarding intersil corporation and its products, see www.intersil.com fn6229.0 march 17, 2006 ISL55100B quad flat no-lead plastic package (qfn) micro lead frame pl astic package (mlfp) l72.10x10 72 lead quad flat no-lead plastic package symbol millimeters notes min nominal max a 0.80 0.90 1.00 - a1 - 0.02 0.05 - a2 - 0.65 1.00 9 a3 0.20 ref 9 b 0.18 0.25 0.30 5, 8 d 10.00 bsc - d1 9.75 bsc 9 d2 5.85 6.00 6.15 7, 8 e 10.00 bsc - e1 9.75 bsc 9 e2 5.85 6.00 6.15 7, 8 e 0.50 bsc - k0.20 - - - l 0.30 0.40 0.50 8, 10 n722 nd 18 3 ne 18 3 p- -0.609 --129 rev. 1 11/04 notes: 1. dimensioning and tolerancing conform to asme y14.5-1994. 2. n is the number of terminals. 3. nd and ne refer to the number of terminals on each d and e. 4. all dimensions are in millimeters. angles are in degrees. 5. dimension b applies to the meta llized terminal and is measured between 0.15mm and 0.30mm from the terminal tip. 6. the configuration of the pin #1 identifier is optional, but must be located within the zone indicated. the pin #1 identifier may be either a mold or mark feature. 7. dimensions d2 and e2 are fo r the exposed pads which provide improved electrical and thermal performance. 8. nominal dimensions are provided to assist with pcb land pattern design efforts, see intersil technical brief tb389. 9. features and dimensions a2, a3, d1, e1, p & are present when anvil singulation method is used and not present for saw singulation. 10. compliant to jedec mo-220vnnd-3 except for the "l" min dimension.

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